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SIMS characterization of TiN diffusion barrier layer on steel substrate
Dec 18, 2018
Project
Date
Dec 18, 2018
Event
4th IEEE International conference on Emerging Electronics 2018
Location
Royal Orchid Centre, Bangalore, India
Heterojunction Lab
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Optimization of controlled two-step liquid phase crystallization of Ge-on-Si
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Laser crystallization of amorphous Ge thin films using pulsed Nd: YAG
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