| Title | Electron microscopy investigations of purity of AlN interlayer in AlxGa1?xN/GaN heterostructures grown by plasma assisted molecular beam epitaxy |
| Publication Type | Journal Article |
| Year of Publication | 2013 |
| Authors | Rao, DVSridhar, Jain, A, Lamba, S, Muraleedharan, K, Muralidharan, R |
| Journal | Appl. Phys. Lett |
| Volume | 102 |
