| Title | Inverse temperature dependence of reverse gate leakage current in AlGaN/GaN HEMT |
| Publication Type | Journal Article |
| Year of Publication | 2012 |
| Authors | Kaushik, JK, Balakrishnan, VR, Panwar, BS, Muralidharan, R |
| Journal | Semiconductor Science and Technology |
| Volume | 28 |
| Pagination | 015026 |
