Sorry, you need to enable JavaScript to visit this website.
office.cense@iisc.ac.in | +91-80-2293 3276/ +91-80-2293 3291 | Sitemap

Modelling the Effect of Residual Stress and Perforations on the Dynamic Characteristics of MEMS Devices

TitleModelling the Effect of Residual Stress and Perforations on the Dynamic Characteristics of MEMS Devices
Publication TypeJournal Article
Year of Publication2009
AuthorsPandey, AKumar, Pratap, R
JournalAdvances in Vibration Engineering
Volume8
Research Area: