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Filters: Keyword is Semiconductor device measurement [Clear All Filters]

Conference Paper

E. W. Lee, Ma, L. , Nath, D. N. , Lee, C. H. , Wu, Y. , and Rajan, S. , “Demonstration of 2D/3D p-MoS2/n-SiC junction”, in 72nd Device Research Conference, 2014, pp. 79-80.

S. Shekhar, Vinoy, K. J. , and Ananthasuresh, G. K. , “Design, fabrication and characterization of capacitive RF MEMS switches with low pull-in voltage”, in 2014 IEEE International Microwave and RF Conference (IMaRC), 2014, pp. 182-185.

Journal Article

R. Padmanabhan, Mohan, S. , Morozumi, Y. , Kaushal, S. , and Bhat, N. , “Performance and Reliability of TiO 2/ZrO 2/TiO 2 (TZT) and AlO-Doped TZT MIM Capacitors”, IEEE Transactions on Electron Devices, vol. 63, pp. 3928–3935, 2016.

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