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Publications

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S. Kumar, Remesh, N. , Dolmanan, S. B. , Tripathy, S. , Raghavan, S. , Muralidharan, R. , and Nath, D. N. , Interface traps at Al2O3/InAlN/GaN MOS-HEMT-on-200 mm Si, Solid-State Electronics, vol. 137, pp. 117–122, 2017.