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Publications

Found 1 results
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Filters: Keyword is edge dislocations  [Clear All Filters]
2020
A. Kalra, Rathkanthiwar, S. , Remesh, N. , Muralidharan, R. , Nath, D. , and Raghavan, S. , Growth-Microstructure-Device Performance Correlations for III-nitride Optoelectronic and Power Devices on Sapphire and Silicon, in 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2020.