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Publications

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Filters: Keyword is Electron traps  [Clear All Filters]
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K
S. Kumar, Gupta, P. , Guiney, I. , Humphreys, C. J. , Raghavan, S. , Muralidharan, R. , and Nath, D. N. , Temperature and Bias Dependent Trap Capture Cross Section in AlGaN/GaN HEMT on 6-in Silicon With Carbon-Doped Buffer, IEEE Transactions on Electron Devices, vol. 64, pp. 4868–4874, 2017.
Y
J. Yang, Cui, S. , Ma, T. P. , Hung, T. H. , Nath, D. N. , Krishnamoorthy, S. , and Rajan, S. , Determination of trap energy levels in AlGaN/GaN HEMT, in Device Research Conference (DRC), 2013 71st Annual, 2013, pp. 79-80.