I. Raja, Banerjee, G. , Zeidan, M. A. , and Abraham, J. A. ,
“A 0.1 #x2013;3.5-GHz Duty-Cycle Measurement and Correction Technique in 130-nm CMOS”,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 24, pp. 1975-1983, 2016.
V. Khatri and Banerjee, G. ,
“A Mitigation Technique for Harmonic Downconversion in Wideband Spectrum Sensors”,
IEEE Transactions on Instrumentation and Measurement, vol. 64, pp. 3226-3238, 2015.
P. K. Saxena and Bhat, N. ,
“SEU reliability improvement due to source-side charge collection in the deep-submicron SRAM cell”,
IEEE Transactions on Device and Materials Reliability, vol. 3, pp. 14-17, 2003.