Sorry, you need to enable JavaScript to visit this website.
office.cense@iisc.ac.in | +91-80-2293 3276/ +91-80-2293 3291 | Sitemap

Publications

Found 2 results
Author Title Type [ Year(Asc)]
Filters: Keyword is integrated circuit reliability  [Clear All Filters]
2015
J. S. Gaggatur and Banerjee, G. , Integrated temperature sensor for reconfigurable radio frequency synthesizer, in Electronics, Computing and Communication Technologies (CONECCT), 2015 IEEE International Conference on, 2015, pp. 1-6.
2003
P. K. Saxena and Bhat, N. , SEU reliability improvement due to source-side charge collection in the deep-submicron SRAM cell, IEEE Transactions on Device and Materials Reliability, vol. 3, pp. 14-17, 2003.