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Publications

Found 1 results
Author Title Type [ Year(Asc)]
Filters: Keyword is two-dimensional device simulation  [Clear All Filters]
2003
P. K. Saxena and Bhat, N. , SEU reliability improvement due to source-side charge collection in the deep-submicron SRAM cell, IEEE Transactions on Device and Materials Reliability, vol. 3, pp. 14-17, 2003.