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Publications

Found 3 results
Author Title [ Type(Desc)] Year
Filters: Keyword is semiconductor device models  [Clear All Filters]
Conference Paper
R. Srinivasan and Bhat, N. , Impact of channel engineering on unity gain frequency and noise-figure in 90nm NMOS transistor for RF applications, in 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design, 2005, pp. 392-396.
Z. Yang, Zhang, Y. , Krishnamoorthy, S. , Nath, D. N. , Khurgin, J. B. , and Rajan, S. , Modeling and experimental demonstration of sub-10 nm base III-nitride tunneling hot electron transistors, in 2015 73rd Annual Device Research Conference (DRC), 2015, pp. 53-54.
A. S. Medury, Majumdar, K. , Bhat, N. , and Bhat, K. N. , Modeling the threshold voltage of ultra-thin-body(UTB) long channel symmetric double-gate (DG) MOSFETs, in Semiconductor Device Research Symposium, 2009. ISDRS '09. International, 2009, pp. 1-2.