Sorry, you need to enable JavaScript to visit this website.
office.cense@iisc.ac.in | +91-80-2293 3276/ +91-80-2293 3291 | Sitemap

Publications

Found 794 results
Author Title Type [ Year(Desc)]
2003
K. Maitra and Bhat, N. , “Analytical approach to integrate the different components of direct tunneling current through ultrathin gate oxides in n-channel metal oxide semiconductor field-effect transistors”, Journal of Applied Physics, vol. 93, pp. 1064–1068, 2003.
H. C. Srinivasaiah and Bhat, N. , “Mixed Mode Simulation Approach to Characterize the Circuit Delay Sensitivity to Implant Dose Variations”, IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, vol. 22, pp. 742–747, 2003.
H. C. Srinivasaiah and Bhat, N. , “Monte Carlo Analysis of the Implant Dose Sensitivity in 0.1 nm NMOSFET”, Solid-State Electronics, vol. 47/8, pp. 1379–1383, 2003.
C. K. Reddy and Pratap, R. , “Multimodal Map and Complex Basin of Attraction of a Simple Hopper”, Physical Review E, vol. 68, 2003.
K. Maitra and Bhat, N. , “Polyreoxidation process step for suppressing edge direct tunneling through ultrathin gate oxides in NMOSFETs”, Solid-State Electronics, vol. 47, pp. 15–17, 2003.
P. K. Saxena and Bhat, N. , “Process technique for SEU reliability improvement of deep sub-micron SRAM cell”, Solid-State Electronics, vol. 47, pp. 661–664, 2003.
P. K. Saxena and Bhat, N. , “SEU Reliability Improvement Due to Source-Side Charge Collection in the Deep-Submicron SRAM Cell”, IEEE Transactions on Device and Material Reliability, pp. 14–17, 2003.
P. K. Saxena and Bhat, N. , “SEU reliability improvement due to source-side charge collection in the deep-submicron SRAM cell”, IEEE Transactions on Device and Materials Reliability, vol. 3, pp. 14-17, 2003.
M. P. Singh, Thakur, C. S. , Shalini, K. , Bhat, N. , and Shivashankar, S. A. , “Structural and Electrical Characterization of Erbium Oxide Films Grown on Si(100) by Low-pressure Metalorganic Chemical Vapour Deposition”, Applied Physics Letters, 2003.
A. K. Pandey and Pratap, R. , “Studies in Nonlinear Effects of Squeeze Film Damping in MEMS Structures”, International Journal of Computational Engineering Science, vol. 4, 2003.
S. Patil, Venkatesh, C. , Bhat, N. , and Pratap, R. , “Voltage Controlled Oscillator using Tunable MEMS Resonator”, International Journal of Computational Engineering Science, vol. 4, 2003.
2004
S. Raghavan, Wang, H. , Porter, W. G. , Dinwiddie, R. B. , Vassen, R. , and Mayo, M. J. , “20 mol % Y(Ta/Nb)O4 Doped Zirconia Thermal Barrier Coatings”, Journal of The American Ceramic Society, vol. 87, pp. 431-437, 2004.
A. Gupta and Bhat, N. , “Back-Gate Effect to Generate Derivative of Neuron Activation Function”, Analog Integrated Circuits and Signal Processing, vol. 41, pp. 89–92, 2004.
A. Ghosh and Maris, H. , “Cavitation in superfluid helium possibly arising from penning ionization of dimers”, Journal of Low Temperature Physics, vol. 134, 2004.
A. K. Pandey and Pratap, R. , “Coupled Nonlinear Effects of Surface Roughness and Rarefaction on Squeeze Film Damping in MEMS Structures”, Journal of Micromech. Microeng, vol. 14, 2004.
A. Jain, Raghavan, S. , and Redwing, J. M. , “Evolution of Surface Morphology and Film Stress during MOCVD growth of InN on Sapphire Substrates”, Journal of Crystal Growth, vol. 269, pp. 128–133, 2004.
H. J. Maris, Ghosh, A. , Konstantinov, D. , and Hirsch, M. , “Experiments to study the effect of light on electron bubbles in liquid helium”, Journal of Low Temperature Physics, vol. 134, 2004.
K. Maitra and Bhat, N. , “Impact of Gate to Source/Drain Overlap Length on 80 nm CMOS Circuit Performance”, IEEE Transactions on Electron Devices, pp. 409–414, 2004.
A. Pogrebnyakov, Redwing, J. M. , Raghavan, S. , Vaithyanathan, V. , Schlom, D. G. , Xu, S. Y. , Li, Q. , Tenne, D. A. , Soukiassian, A. , Xi, X. X. , Johannes, M. D. , Kasinathan, D. , Pickett, W. E. , Wu, J. S. , and Spence, J. C. H. , “Increasing Superconducting Transition Temperature in MGB2 by Strain Induced Bond-Stretching Mode Softening”, Physical Review Letters, vol. 93, pp. 147006–1–4., 2004.
J. D. Acord, Raghavan, S. , Snyder, D. W. , and Redwing, J. M. , “In-situ Stress Measurements During MOCVD Growth of High Al-content AlGaN on SiC”, Journal of Crystal Growth, vol. 272, pp. 65–71, 2004.
S. Raghavan and Redwing, J. M. , “In-situ stress measurements during the MOCVD growth of AlN buffer layers on (111) Si substrates”, Journal of Crystal Growth, vol. 261, pp. 294-300, 2004.
S. Raghavan and Redwing, J. M. , “Intrinsic Stresses in AlN layers grown by MOCVD on (0001) sapphire and (111) Si substrates”, Journal of Applied Physics, vol. 96, pp. 2995–3003, 2004.
N. Bhat, “MEMS for RF Applications”, IETE Technical Review, vol. 21, 2004.
J. S. Mohan and Pratap, R. , “A Natural Classifications of Vibration Models of Polygonal Ducts Based on Group Theoretic Analysis”, Journal of Sound and Vibration, vol. 269, 2004.
R. Singh and Bhat, N. , “An Offset Compensation Technique for Latch Type Sense Amplifier in High Speed Low Power SRAMs”, IEEE Transactions on VLSI Systems, pp. 652–657, 2004.

Pages