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Publications

Found 52 results
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Filters: First Letter Of Last Name is T  [Clear All Filters]
2003
N. Bhat and Thakur, C. S. , Analog CMOS Performance Degradation due to Edge Direct Tunneling (EDT) Current in sub-100nm Technology, Journal of Semiconductor Technology and Science, 2003.
M. P. Singh, Thakur, C. S. , Shalini, K. , Bhat, N. , and Shivashankar, S. A. , Structural and Electrical Characterization of Erbium Oxide Films Grown on Si(100) by Low-pressure Metalorganic Chemical Vapour Deposition, Applied Physics Letters, 2003.

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