Alumni

Education
B.Tech. Mechanical Engineering (2010), NIT Warangal.

Experience
• Design Engineer, Applied Materials India Pvt. Ltd.,.India, (2010-2012).

Theses Title (Year)
Exploring one-dimensional micromechanical resonators with residual stresses for potential sensing applications and measurement of mechanical properties (2019).

Publications
• A. R. Behera, A. Dangi, and R. Pratap, “An experimental study of residual stress induced modulation of vibration characteristics in 1-D MEMS resonators,” ASTM J. Mater. Perform. Charact., vol. 7, no. 4, p. https://doi.org/10.1520/MPC20170156. ISSN 2379-136, 2018.

• A. R. Behera, H. Shaik, G. M. Rao, R. Pratap, “A technique for estimation of residual stress and Young’s modulus of compressively stressed thin films using microfabricated beams”,
IEEE Journal of Microelectromechanical Systems, 28 (6), P 1039-1054, 2019.

Conference and Seminars
• A. R. Behera and R. Pratap, “A study of higher modes of buckled sic beams for stress based sensing applications,” Procedia Eng., vol. 168, pp. 979–982, 2016.

• R. Pratap, A. Dangi, A. R. Behera, “Effect of microfabrication induced stresses on the sensing characteristics of dynamic MEMS devices”, The Electrochemical Society, ECS Transactions, 75 (17) 35-45, 2016.

• R. Pratap, A. R. Behera, “Simultaneous Determination of Young’s Modulus and Residual Stress in PECVD a-SiC from Postbuckling Vibration of MEMS Beams”, The Electrochemical Society, ECS Transactions, 86 (16) 87-100, 2018.

• A. R. Behera and R. Pratap, “On the threshold of stress invariant second mode excitation in buckled MEMS resonators”, IEEE Sensors, 2018, DOI: 10.1109/ICSENS.2018.8589902.

• A. R. Behera, H. Shaik, G. M. Rao, R. Pratap, “Experimental investigation of dynamic characteristics of metal coated buckled micro-beams with electrothermal modulation of residual stress”, IEEE International conference on emerging electronics, 2018.

• N. L. Naveena, Amruta Ranjan Behera, Rudra Pratap, Krishna Chaitanya, “Nanotechnology for management of infestations and grain quality monitoring”, Agriculture Under Climate Change: Threats, Strategies and Policies, 25, P 160-167, 2017.

Research Area Gallery

Fig. 1. Fixed-fixed beams fabricated from amorphous silicon carbide films deposited by PECVD. The beam is buckled due to presence of compressively residual stress in the thin film.

Fig. 2. An array of such buckled beams of varying dimensions.

Fig. 3. Non-dimensional frequency (first four modes) vs. Non-dimensional axial load parameter plot for compressive residual stress carrying buckled PECVD-SiCx beams. Solid-lines and points show the analytical prediction and measured natural frequencies respectively and the dashed lines show the sensitivity of frequency to residual stress.