Sorry, you need to enable JavaScript to visit this website. | +91-80-2293 3276/ +91-80-2293 3291 | Sitemap

Micro and Nano Characterization Methods

Course Code: 
NE 201
Course Credit: 
August - December

This course provides training in the use of various device and material characterization techniques. Optical characterization: optical microscopy, thin film measurement, ellipsometry and Raman spectroscopy; Electrical characterization: Noise in electrical measurements, Resistivity with 2- probe, 4-probe and van der Pauw technique, Hall mobility, DC I-V and High frequency C-V characterization; Mechanical characterization: Laser Doppler vibrometry, Scanning acoustic microscopy, Optical profilometry, and Micro UTM; Material characterization: Scanning electron microscopy, Atomic force microscopy, XRD, and Focused ion beam machining.

Instructors:  Akshay Naik and Manoj Varma.