| Title | Analog/RF Built-in-Self-Test Subsystem for a Mobile Broadcast Video Receiver in 65-nm CMOS |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Banerjee, G, Behera, M, Zeidan, MA, Chen, R, Barnett, K |
| Journal | IEEE Journal of Solid-State Circuits |
| Volume | 46 |
| Pagination | 1998-2008 |
| Date Published | Sept |
| ISSN | 0018-9200 |
| Keywords | A/D converter, Analog, analog-RF built-in-self-test subsystem, analogue-digital conversion, automatic test equipment, BIST, built in self-test, built-in self test, Built-in self-test, CMOS, CMOS image sensors, CMOS sensors, digital transfer, distributed network, Gain measurement, mobile broadcast video receiver, mobile radio, Noise, Noise measurement, perturbation-correlation based BIST method, perturbation/correlation, Radio frequency, radio receivers, RF, Sensors, serial bus interface, size 65 nm, test cost, test time, video equipment, Voltage measurement, word length 12 bit |
| Abstract | A built-in-self-test (BIST) subsystem embedded in a 65-nm mobile broadcast video receiver is described. The subsystem is designed to perform analog and RF measurements at multiple internal nodes of the receiver. It uses a distributed network of CMOS sensors and a low bandwidth, 12-bit A/D converter to perform the measurements with a serial bus interface enabling a digital transfer of measured data to automatic test equipment (ATE). A perturbation/correlation based BIST method is described, which makes pass/fail determination on parts, resulting in significant test time and cost reduction. |
| DOI | 10.1109/JSSC.2011.2159055 |
