Sorry, you need to enable JavaScript to visit this website.
office.cense@iisc.ac.in | +91-80-2293 3276/ +91-80-2293 3291 | Sitemap

Analog CMOS Performance Degradation due to Edge Direct Tunneling (EDT) Current in sub-100nm Technology

0
TitleAnalog CMOS Performance Degradation due to Edge Direct Tunneling (EDT) Current in sub-100nm Technology
Publication TypeJournal Article
Year of Publication2003
AuthorsBhat, N, Thakur, CS
JournalJournal of Semiconductor Technology and Science
Date Publishedsep
Research Area: 
Electronics