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Impact of Gate to Source/Drain Overlap Length on 80 nm CMOS Circuit Performance

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TitleImpact of Gate to Source/Drain Overlap Length on 80 nm CMOS Circuit Performance
Publication TypeJournal Article
Year of Publication2004
AuthorsMaitra, K, Bhat, N
JournalIEEE Transactions on Electron Devices
Pagination409–414
Research Area: 
Electronics