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Interface-state generation under radiation and high field stressing in reoxidized nitrided oxide MOS capacitors

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TitleInterface-state generation under radiation and high field stressing in reoxidized nitrided oxide MOS capacitors
Publication TypeJournal Article
Year of Publication1992
AuthorsBhat, N, Vasi, J
JournalIEEE Transactions on Nuclear Science
Pagination2230
Research Area: 
Electronics