Sorry, you need to enable JavaScript to visit this website.
office.cense@iisc.ac.in | +91-80-2293 3276/ +91-80-2293 3291 | Sitemap

Monte Carlo Analysis of the Implant Dose Sensitivity in 0.1 nm NMOSFET

TitleMonte Carlo Analysis of the Implant Dose Sensitivity in 0.1 nm NMOSFET
Publication TypeJournal Article
Year of Publication2003
AuthorsSrinivasaiah, HC, Bhat, N
JournalSolid-State Electronics
Volume47/8
Pagination1379–1383
Research Area: