H. C. Srinivasaiah and Bhat, N. ,
“Mixed Mode Simulation Approach to Characterize the Circuit Delay Sensitivity to Implant Dose Variations”,
IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, vol. 22, pp. 742–747, 2003.
H. C. Srinivasaiah and Bhat, N. ,
“Monte Carlo Analysis of the Implant Dose Sensitivity in 0.1 nm NMOSFET”,
Solid-State Electronics, vol. 47/8, pp. 1379–1383, 2003.