S. Bhattacharjee, Ganapathi, K. L. , Mohan, S. , and Bhat, N. ,
“Interface Engineering of High-k Dielectrics and Metal Contacts for High Performance Top-Gated MoS2 FETs”,
ECS Transactions, vol. 80, pp. 101–107, 2017.
S. Bhattacharjee, Ganapathi, K. L. , Mohan, S. , and Bhat, N. ,
“Interface Engineering of High-k Dielectrics and Metal Contacts for High Performance Top-Gated MoS2 FETs”,
ECS Transactions, vol. 80, pp. 101–107, 2017.
L. Ganapathi Kolla, Ding, Y. , Misra, D. , and Bhat, N. ,
“Interface states reduction in atomic layer deposited TiN/ZrO2/Al2O3/Ge gate stacks”,
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, vol. 36, p. 021201, 2018.
S. Bhattacharjee, Ganapathi, K. L. , Nath, D. N. , and Bhat, N. ,
“Intrinsic Limit for Contact Resistance in Exfoliated Multilayered MoS2 FET”,
IEEE Electron Device Letters, vol. 37, pp. 119-122, 2016.
S. Bhattacharjee, Ganapathi, K. L. , Nath, D. N. , and Bhat, N. ,
“Intrinsic Limit for Contact Resistance in Exfoliated Multilayered MoS2 FET”,
IEEE Electron Device Letters, vol. 37, pp. 119-122, 2016.
S. Bhattacharjee, Ganapathi, K. Lakshmi, Nath, D. N. , and Bhat, N. ,
“Intrinsic limit for contact resistance in exfoliated multilayered MoS 2 FET”,
IEEE Electron Device Letters, vol. 37, pp. 119–122, 2016.
S. Bhattacharjee, Ganapathi, K. Lakshmi, Nath, D. N. , and Bhat, N. ,
“Intrinsic limit for contact resistance in exfoliated multilayered MoS 2 FET”,
IEEE Electron Device Letters, vol. 37, pp. 119–122, 2016.
K. B Bharadwaj, Chandrasekar, H. , Nath, D. , Pratap, R. , and Raghavan, S. ,
“Intrinsic limits of channel transport hysteresis in graphene-SiO2 interface and its dependence on graphene defect density”,
Journal of Physics D: Applied Physics, vol. 49, p. 265301, 2016.
K. Majumdar, V.R., K. , Murali, M. , Bhat, N. , and Lin, Y. - M. ,
“Intrinsic limits of subthreshold slope in biased bilayer graphene transistor”,
Applied Physics Letters, vol. 96, p. 123504, 2010.
J. K. Kaushik, Balakrishnan, V. R. , Panwar, B. S. , and Muralidharan, R. ,
“Inverse temperature dependence of reverse gate leakage current in AlGaN/GaN HEMT”,
Semiconductor Science and Technology, vol. 28, p. 015026, 2012.
D. Visser, Ye, Z. , Prajapati, C. S. , Bhat, N. , and Anand, S. ,
“Investigations of Sol-Gel ZnO Films Nanostructured by Reactive Ion Beam Etching for Broadband Anti-Reflection”,
ECS Journal of Solid State Science and Technology, vol. 6, pp. P653–P659, 2017.