S. D. Vishwakarma, Pandey, A. K. , Parpia, J. M. , Southworth, D. R. , Craighead, H. G. , and Pratap, R. ,
“Evaluation of Mode Dependent Fluid Damping in a High Frequency Drumhead Microresonator”,
Journal of Microelectromechanical Systems, vol. 23, pp. 234-246, 2014.
H. Chandrasekar, Singh, M. , Raghavan, S. , and Bhat, N. ,
“Estimation of background carrier concentration in fully depleted GaN films”,
Semiconductor Science and Technology, vol. 30, p. 115018, 2015.
K. Chakraborty, Kumawat, N. , Sultana, S. , and Varma, M. M. ,
“Enhancing the quality factor of grating coupled plasmon resonance in optical recording media”,
Sensors and Actuators A: Physical, vol. 244, pp. 50–55, 2016.
J. Yang, Cui, S. , Ma, T. P. , Hung, T. - H. , Nath, D. N. , Krishnamoorthy, S. , and Rajan, S. ,
“Electron tunneling spectroscopy of electrically active traps in AlGaN/GaN high electron mobility transistors”,
Applied Physics Letters, vol. 103, p. 223507, 2013.
S. Mukhopadhyay, Mitra, S. , Ding, Y. I. Ming, Ganapathi, K. L. , Misra, D. , Bhat, N. , Tapily, K. , Clark, R. D. , Consiglio, S. , Wajda, C. S. , and , ,
“Effect of post plasma oxidation on Ge gate stacks interface formation”,
ECS Transactions, vol. 72, pp. 303–312, 2016.
S. Mukhopadhyay, Mitra, S. , Ding, Y. I. Ming, Ganapathi, K. L. , Misra, D. , Bhat, N. , Tapily, K. , Clark, R. D. , Consiglio, S. , Wajda, C. S. , and , ,
“Effect of post plasma oxidation on Ge gate stacks interface formation”,
ECS Transactions, vol. 72, pp. 303–312, 2016.