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Publications

Found 266 results
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2012
S. M. Mohanasundaram, Pratap, R. , and Ghosh, A. , “Electromigration: A Unique Tool for Microstructure Engineering in Metal Films”, International Journal of Applied Physics and Mathematics, vol. 2, pp. 2426-2431, 2012.
M. K Bhat, Mandal, S. , Pathak, S. , G Saravanan, S. , Sridhar, C. , Badnikar, S. L. , Vyas, H. P. , Muralidharan, R. , Jain, M. K. , and Subrahmanyam, A. , “Gate recess structure engineering using silicon-nitride-assisted process for increased breakdown voltage in pseudomorphic HEMTs”, Semicond. Sci. Technol, vol. 27, 2012.
M. K Bhat, Mandal, S. , Pathak, S. , G Saravanan, S. , Sridhar, C. , Badnikar, S. L. , Vyas, H. P. , Muralidharan, R. , Jain, M. K. , and Subrahmanyam, A. , “Gate recess structure engineering using silicon-nitride-assisted process for increased breakdown voltage in pseudomorphic HEMTs”, Semicond. Sci. Technol, vol. 27, 2012.
G. R. Prashanth, Murali, P. , Varma, M. M. , and Bhat, N. , “In-situ impedance spectroscopy of layer-by-layer self-assembly of polyelectrolytes”, in Emerging Electronics (ICEE), 2012 International Conference on, 2012, pp. 1-4.
J. K. Kaushik, Balakrishnan, V. R. , Panwar, B. S. , and Muralidharan, R. , “Inverse temperature dependence of reverse gate leakage current in AlGaN/GaN HEMT”, Semiconductor Science and Technology, vol. 28, p. 015026, 2012.
V. Mishra, Raghavan, S. , Bhat, N. , and Pratap, R. , “Micro and Nano Characterization Facility: Operations Methodology and Technical Management”, in 2012 19th Biennial University/Government/Industry, Micro/Nano Symposium (UGIM), 2012, pp. 1-1.
T. U. M. S. Murthy, Vijayaraghavan, M. N. , Savitha, P. , Hegde, G. , Raghavan, S. , Kumar, P. S. A. , Pratap, R. , and Bhat, N. , “National Nanofabrication Centre at IISc Bangalore: A Chronicle of Design, Construction and Management of Cleanroom in Indian Context”, in 2012 19th Biennial University/Government/Industry, Micro/Nano Symposium (UGIM), 2012, pp. 1-1.
A. Ghosh and Maris, H. J. , “Optical Properties of 1P State Electron Bubbles in Liquid Helium-4”, Journal of Physics: Conference Series, vol. 400, p. 012011, 2012.
K. L. Ganapathi, Bhat, N. , and Mohan, S. , “Optimization of oxygen flow rate for e-beam evaporated HfO2 thin films”, in Emerging Electronics (ICEE), 2012 International Conference on, 2012, pp. 1-4.
D. N. Nath, Park, P. Sung, Esposto, M. , Brown, D. , Keller, S. , Mishra, U. K. , and Rajan, S. , “Polarization Engineered 1-dimensional Electron Gas Arrays”, Journal of Applied Physics, vol. 111, p. 043715, 2012.
J. W. Nicholson, Fini, J. M. , DeSantolo, A. M. , Liu, X. , Feder, K. , Westbrook, P. S. , Supradeepa, V. R. , Monberg, E. , DiMarcello, F. , Ortiz, R. , Headley, C. , and DiGiovanni, D. J. , “Scaling the effective area of higher-order-mode erbium-doped fiber amplifiers”, Optics Express, vol. 20, no. 22, pp. 24575-24584, 2012.
R. M, B, A. , KV, S. , and Sikdar, S. K. , “A study of epileptogenic network structures in rat hippocampal cultures using first spike latencies during synchronization events”, Physical Biol, 2012.
B. Chakraborty, Bera, A. , Muthu, D. V. S. , Bhowmick, S. , Waghmare, U. V. , and Sood, A. K. , “Symmetry-dependent phonon renormalization in monolayer MoS2 transistor”, Phys. Rev. B (Rapid Communications)., vol. 85. p. 161403, 2012.
S. M. Mohanasundaram, Pratap, R. , and Ghosh, A. , “Tuning the sensitivity of a metal-based piezoresistive sensor using electromigration”, Journal of Microelectromechanical Systems, vol. 21, pp. 1276-1278, 2012.
S. M. Mohanasundaram, Pratap, R. , and Ghosh, A. , “Two orders of magnitude increase in metal piezoresistor sensitivity through nanoscale inhomogenization”, Journal of Applied Physics, vol. 112, pp. 084332-9, 2012.
D. Venkateswarlu, Mohanan, P. V. , Joshi, R. S. , and Kumar, P. S. A. , “Understanding the Magnetization Reversal in Six-Fold Anisotropic Hexagonal Networks”, IEEE Transactions on Magnetics, vol. 48, pp. 2793-2796, 2012.
2013
A. Ghosh, Mandal, P. , Karmakar, S. , and Ghosh, A. , “Analytical theory and stability analysis of an elongated nanoscale object under external torque”, Physical Chemistry Chemical Physics, vol. 15, pp. 10817–10823, 2013.
R. Mudachathi, Shivananju, B. N. , Prashanth, G. R. , Asokan, S. , and Varma, M. M. , “Calibration of Etched Fiber Bragg Grating Sensor Arrays for Measurement of Molecular Surface Adsorption”, Journal of Lightwave Technology, vol. 31, pp. 2400-2406, 2013.
S. M. Mohanasundaram, Pratap, R. , and Ghosh, A. , “A cantilever resonator with integrated actuation and sensing fabricated using a single step lithography”, IEEE Sensors Journal, vol. 13, 2013.
R. Koushik, Kumar, S. , Amin, K. R. , Mondal, M. , Jesudasan, J. , Bid, A. , Raychaudhuri, P. , and Ghosh, A. , “Correlated conductance fluctuations close to the Berezinskii-Kosterlitz-Thouless transition in ultra-thin NbN films”, Physical Review Letters, vol. 111., 2013.
M. R. Laskar, Ma, L. , K, S. K. , Park, P. Sung, Krishnamoorthy, S. , Lee, II, E. , Shao, Y. , Nath, D. N. , Lu, W. , Wu, Y. , and Rajan, S. , “CVD of Single Crystal (0001) Oriented MoS2 Thin Film Over a Large Area”, Applied Physics Letters, vol. 102, p. 252108, 2013.
S. Chaturvedi, Saravanan, S. G. , Bhat, M. K. , Bhalke, S. , Badnikar, S. L. , Muralidharan, R. , and Koul, S. K. , “Design and Electrical Characterization of Wafer-level Micro-package for GaAs-based RFMEMS Switches”, IETE Journal of Research, vol. 59, 2013.
J. Yang, Cui, S. , Ma, T. P. , Hung, T. H. , Nath, D. N. , Krishnamoorthy, S. , and Rajan, S. , “Determination of trap energy levels in AlGaN/GaN HEMT”, in Device Research Conference (DRC), 2013 71st Annual, 2013, pp. 79-80.
D. V. Sridhar Rao, Jain, A. , Lamba, S. , Muraleedharan, K. , and Muralidharan, R. , “Electron microscopy investigations of purity of AlN interlayer in AlxGa1?xN/GaN heterostructures grown by plasma assisted molecular beam epitaxy”, Appl. Phys. Lett, vol. 102, 2013.
D. V. Sridhar Rao, Jain, A. , Lamba, S. , Muraleedharan, K. , and Muralidharan, R. , “Electron microscopy investigations of purity of AlN interlayer in AlxGa1?xN/GaN heterostructures grown by plasma assisted molecular beam epitaxy”, Appl. Phys. Lett, vol. 102, 2013.

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